先進測試論壇

As AI is driving greater system complexity, reliability is no longer a device-level metric, it must be addressed end to end, requiring closer collaboration across the semiconductor value chain—from silicon innovation to system deployment.​

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The 2026 Advanced Testing Forum, themed “From Silicon to System: Redefining Reliability in the AI Age,” will explore how testing is transforming into a strategic enabler across this ecosystem. As technologies such as chiplets, high-bandwidth memory, and high-power AI systems accelerate innovation, testing must move upstream and connect more closely across design, manufacturing, and system-level validation.​

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Bringing together leaders across the semiconductor, system, and AI ecosystems, the forum will serve as a platform for dialogue, alignment, and collaboration. It will highlight the growing role of testing in building the reliable foundation needed for the next wave of AI technologies.