Ohmplus Technology Inc.

Dr. Bryan Chu, CEO, Ohmplus Technology Inc.

Dr. Bryan Chu is the CEO of Ohmplus Technology Inc., where he leads a company advancing phased-array measurement, testing, and calibration technology. He bridges frontier sensing and communications research with commercial strategy, holding a Ph.D. from the Graduate Institute of Space Science at National Central University, with core expertise in wireless communication systems, remote sensing, and data fusion.

He began his career as an Assistant Researcher at the National Chung-Shan Institute of Science and Technology (NCSIST), Taiwan's premier defense research organization, and later served as a Researcher at National Central University's Communication Systems Research Center—experience that gave him a rare command of the technologies now driving the industry.

Dr. Chu has since applied that expertise to building and scaling ventures. He previously served as Deputy General Manager of 極隼科技, leading corporate governance and business development, and is a co-founder of 維波科技. Across these roles he combines deep engineering knowledge with the commercial vision to turn sophisticated R&D into market-ready products, forge partnerships, and open new markets—work he now drives at the helm of Ohmplus.

Topic:

From Phased Arrays to Silicon: AI-Accelerated Array Calibration for High-Throughput RF Semiconductor Multi-Site Testing

Abstract:

Millimeter-wave phased arrays and the RF semiconductor devices inside them share one bottleneck: every element or die must be characterized over the air, and conventional element-by-element switching makes calibration and test time scale linearly with channel count. The result is minutes per array and a cost structure that does not survive volume production.

Ohmplus Technology, a National Taiwan University spin-off from the Value Creation program, inverts the measurement problem. Instead of probing one element at a time, the OHM+ Fast engine transmits a controlled sequence of phase-and-amplitude array patterns and uses AI-accelerated convergence to solve for every element's calibration coefficient simultaneously from a single transceiver. A 64-element array is fully calibrated in under 3 seconds - more than ten times faster than switch-based approaches - with amplitude and phase error held within 1 bit, and up to 10% of failed elements identified and compensated in situ rather than scrapped.

The same mathematics transfers directly to the semiconductor test floor. By substituting RFICs on a multi-site load board for antenna elements in an array, one transceiver emulates the throughput of many, enabling simultaneous AiP and RF chip group testing with no site switching - an approach now being adopted by tier-one IC companies.

This presentation covers the algorithmic core, the three-generation co-design path from hardware acceleration to software acceleration to the 2025 hardware/software-fused portable platform, and measured results from production deployments in satellite ground terminals and RF semiconductor test.

Key Technologies Covered:

AI-accelerated phased array calibration (OHM+ Fast): all elements solved simultaneously from a single transceiver
Controlled phase and amplitude array-pattern excitation in place of element-by-element switching
Sub-3-second automatic calibration of a 64-element array, over 10x faster than conventional methods
1-bit amplitude and phase measurement accuracy for BFIC gain and phase trimming
Online recovery: in-situ detection and compensation of up to 10% failed antenna elements
Multi-site group testing of RFICs and AiP modules with no site switching (up to 32 DUTs in parallel)
OTA near-field measurement of EIRP, G/T, axial ratio, radiation pattern, EVM and ACPR
Frequency-agnostic architecture with no upper frequency limitation, from 5G/B5G mmWave upward
Hardware/software co-design with instrument abstraction across Keysight, Rohde & Schwarz, Anritsu and NI platforms
Tileable phased array development kit (DPA): multi-BFIC support, reference designs and SDK for rapid prototyping