Mr. Roger Hwang

Experiences in semiconductor testing for over 30 years including Test Development, Test Automation, Test Analytics, ranging from wafer probing, final test, burn-in and system level test. 

Lead ASE test development team working on leading edge SiP test solutions for applications such as LEO, optics, and wearables.     

Recently focus on AI agent development using test data to facilitate yield learning for failure analysis and in-line trouble-shooting in the entire process flow from assembly to testing.