Dr. Roy Pinhassi

Dr. Roy Pinhassi is a Metrology Director at Camtek, leading advanced specializing in enabling high-yield manufacturing for HBM, chiplet architecture and heterogeneous integration through metrology-driven process control.

Previously, Dr. Pinhassi held senior business and product leadership roles at Nova Ltd and Applied Materials, where he led product strategy, customer engagements, and expansion of advanced process technologies into new markets.

He holds a Ph.D. from Technion and has published research in leading scientific journals. Dr. Pinhassi’s work focuses on bridging deep technology innovation with scalable, high-volume semiconductor manufacturing