From Front-End to Advanced Packaging: Scalable AI-Ready Data Platform, Secure Data Exchange and Ecosystem Collaboration
As IC design shifts from monolithic SoCs to chiplet-based, heterogeneously integrated systems, the boundary between design and manufacturing is dissolving. 2.5D interposers and CoWoS, hybrid bonding, and 3D stacking introduce yield sensitivities, defect mechanisms, and multi-physics interactions that design teams can no longer treat as a downstream concern. Realizing the promise of chiplet architecture, and the system-level optimization the industry is now pursuing, depends on the ability to securely bring and analyze data from across the design and manufacturing ecosystem. This talk presents PDF Solutions' perspective on how to combine into an integrated operations solution and AI-first data platform, a secure remote data exchange solution and an overall ability to orchestrate processes across the supply chain.
This integrated AI ready operations solution is designed to handle the large data sets of semiconductor manufacturing, through the entire supply chain, from design, through test operations. We first describe the main component of the PDF Solutions Exensio Aurora architecture. Then cover the role of secure data access and exchange across the manufacturing supply chain,
Finally, we address the analytics infrastructure required to operationalize this learning at scale. As advanced packaging adds multiple test insertions and complex die-feed-forward requirements, Exensio's In-line Traceability, Scalable Analytics, and the StudioAI layer enable a more complete approach to adaptive test: rather than static binning rules, AI models trained on correlated die and process histories are continuously updated and deployed across the supply. We show how this differs from legacy adaptive test implementations and what it unlocks for multi-chiplet assemblies, and for the design and system teams that depend on them.
Key Technologies Covered
- Advanced Packaging
- Chiplet Architectures
- Heterogeneous Integration
- Design Technology Co-Optimization (DTCO)
- AI ready data platform
- Data Feed Forward
- Adaptive Test
- AI-Driven Semiconductor Manufacturing Analytics
- Supply Chain Data Integration