The State of the Art in Photonic Device Testing

2:35 pm - 3:00 pm

This paper will examine five test insertion points defined in the Heterogeneous Integration Roadmap (HIR) and highlight the innovative test solutions being developed across the industry to address these challenges.

Moving beyond the optical device test cells in development, this paper will explore the optical test equipment which needs to be connected to the test cells in order to effectively evaluate the photonic wafers, chiplets, modules, and systems. The broad diversity of solutions and approach being pursued by the industry, to meet this fundamental need will dilute our resolve. This will likely result in deploying multiple customer specific solutions which will drive up costs and reduce flexibility and availability,

In summarizing, this paper will issue a call-to-action for the industry to work together to define a highly-flexible and scalable optical test cell which can be handle a diversity of devices with minimum switch-over time while preserving the capability to do high-performance device test at a reasonable cost.

Key Technologies Covered

The industry’s approach for doing photonic device testing.
Challenges with this plan.
An approach for testing photonic devices which is cost-effective, scalable, and highly-flexible.
A call-to-action for the industry to work together to confirm will support a robust HVM ramp of many different photonic devices.

Featured Speakers

Mr. Dave Armstrong

Fellow, ISE Labs, a subsidiary of ASE, Inc.

Dave Armstrong is a Fellow at ISE Labs, where he leads the development of a production-ready optical test platform. Headquartered in Fremont, California, ISE Labs is a leading provider of semiconductor engineering services, offering advanced wafer-level test, burn-in, reliability, and qualification solutions for AI and HPC applications. ISE Labs is a subsidiary of ASE, Inc.

Previously, Dave spent decades at Advantest developing leading-edge test solutions for hyperscale devices before leading the company's optical test strategy. He also chaired the optical test roadmap committees for both the Heterogeneous Integration Roadmap (HIR) and the International Photonic Systems Roadmap (IPSR), helping shape the industry's direction for production-ready optical testing.