505a 會議室/ 南港展覽館一館五樓 Friday, September 20
8:30am to 4:15pm


Date:Friday, September 20th, 2019
Time:08:30 - 16:15 (08:30-09:00 for registration)
Venue:Room 505a, 5F, TaiNEX 1 / 台北南港展覽館一館 5樓 505a會議室
Theme:  Inspection and Metrology Technologies Improving Semiconductor Manufacturing
Outline:  The Semiconductor Advanced Inspection and Metrology Forum is focusing on technologies of inspection and metrology which affect the semiconductor manufacturing significantly and drive the growth of market. The global market of semiconductor inspection equipment is expected to reach US$ 5300 million by 2024, from US$ 3360 million in 2019. To facilitate the development of semiconductor inspection and metrology, SEMI Inspection and Metrology Committee has been established. The committee and this forum provide a platform for communications and aim to create the advanced solutions of inspection and metrology for semiconductor industry.

SEMI 會員價
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* Forum agenda is subject to change


Fong-Zhi Chen
Deputy Director General
Taiwan Instrument Research Institute, National Applied Research Laboratories
Wei-En Fu
Director of Measurement Standards and Precision Instrumentation Division
YiLi Tsai
Director of Application Engineering Department
HORIBA Taiwan, lnc.
Corner Chen
Leader of Sales Dept. (Scientific)
HORIBA Taiwan, lnc.
Hung-Ming Tai
Director of Instrumentation and Sensing Technology Development Division
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