505ab 會議室/ 南港展覽館一館五樓 Thursday, September 19
9:00am to 4:20pm

Date:Thursday, September. 19th, 2019
Time:09:00 - 16:20 (09:00-09:30 for registration)
Venue:南港展覽館一館5樓 505ab會議室
Theme: 5G & AI-assisted test
Forum Chairs:

  • Dr. Cheng-Wen Wu 吳誠文, 副校長, 國立成功大學/ 共同主席, SEMI Taiwan測試委員會
  • Mr. CJ Hsieh 謝承儒, 總經理, 英特爾創新科技/ 共同主席, SEMI Taiwan測試委員會

Forum Vice Chair:

  • Ms. Wendy Chen 陳文如, 協理, 京元電子/ 副主席, SEMI Taiwan測試委員會



With the dynamic development of IC industry driven by applications like 5G, HPC, IoT, AI and Automotive; semiconductor testing faces major paradigm shift with the eager needs to develop new testing concept and capability to cope with the rising complexity of ICs and systems to ensure their reliability and safety.  5G technology, one of the most heated applications, challenges the entire testing ecosystem to develop new system level test methodology for accuracy and quality while at the same time to balance cost and time to volume.  And with the development of AI, testing data generated through design and manufacturing process has become one of the most valuable resources for industry to enhance their testing capability.    

To lead and to facilitate industry technology development on testing, the theme for the very first Advanced Testing Forum in SEMICON Taiwan will be “5G and AI-assisted Test”.  The forum will cover the perspectives from policy and infrastructure to design and manufacturing to discuss standardization, system level test, mmWave test, OTA, AiP device, AI-assisted test and many other exciting topics!  Join us to find out how MOEA 5G Technology Program Office, Qualcomm, MediaTek, SPIL, KYEC, Advantest, Teradyne, CHPT see the future of 5G testing and how installing AI could enhance it to the next level!


SEMI 會員價
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Sponsored by:





* Forum agenda is subject to change




Mr. CJ Hsieh 謝承儒
Mr. Artun Kutchuk
Vice President of Business Development and Strategy
Dr. Patrick Huang 黃振權
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