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Advanced Testing Forum

Room 505ab, 5F, TaiNEX 1 Thursday, September 19
9:00am to 4:20pm

Date:Thursday, September 19th, 2019
Time:09:00 - 16:20 (09:00-09:30 for registration)
Venue:Room 505ab, 5F, TaiNEX 1
Theme: 5G & AI-assisted Test

Forum Chairs:

  • Dr. Cheng-Wen Wu, Executive Vice President, National Cheng Kung University/ Co-Chair, SEMI Taiwan Testing Committee
  • Mr. CJ Hsieh, General Manager, INTEL Innovation Tech. Ltd./ Co-Chair, SEMI Taiwan Testing Committee

Forum Vice Chair:

  • Ms. Wendy Chen, Associate Vice President, King Yuan Electronics Co., Ltd./ Vice Chair, SEMI Taiwan Testing Committee

Moderators:

  • Morning session: Dr. Cheng-Wen Wu, Executive Vice President, National Cheng Kung University/ Co-Chair, SEMI Taiwan Testing Committee
  • Afternoon session: Mr. CJ Hsieh, General Manager, INTEL Innovation Tech. Ltd./ Co-Chair, SEMI Taiwan Testing Committee

Outline: 

With the dynamic development of IC industry driven by applications like 5G, HPC, IoT, AI and Automotive; semiconductor testing faces major paradigm shift with the eager needs to develop new testing concept and capability to cope with the rising complexity of ICs and systems to ensure their reliability and safety.  5G technology, one of the most heated applications, challenges the entire testing ecosystem to develop new system level test methodology for accuracy and quality while at the same time to balance cost and time to volume.  And with the development of AI, testing data generated through design and manufacturing process has become one of the most valuable resources for industry to enhance their testing capability.    

To lead and to facilitate industry technology development on testing, the theme for the very first Advanced Testing Forum in SEMICON Taiwan will be “5G and AI-assisted Test”.  The forum will cover the perspectives from policy and infrastructure to design and manufacturing to discuss standardization, system level test, mmWave test, OTA, AiP device, AI-assisted test and many other exciting topics!  Join us to find out how MOEA 5G Technology Program Office, Qualcomm, MediaTek, SPIL, KYEC, Advantest, Teradyne, CHPT see the future of 5G testing and how installing AI could enhance it to the next level!

 

 
Early-bird
(7/10-8/30)
Original
(8/31-9/20)
SEMI Member
(7/10-9/20)
Group Registration
(7/10-9/20)
Free Free Free

Free
(More than 5 people)

*Tax Included

 
 
Sponsored by:

 

 

 

 
 
* Forum agenda is subject to change

If SEMI should be unable to hold the exhibition/forum for any cause beyond its reasonable control, SEMI has the right to cancel the exhibit/forum with no further liability than a refund of the ticket price. SEMI shall in no event be liable for incidental or consequential damages to registrants arising from or relating to such cancellation.

For further information, please visit our website. http://www.semicontaiwan.org/en/agenda-glance

 
 
     
       

 

 

Do you want to attend this session? REGISTER NOW!

Dr. Cheng-Wen Wu
Executive Vice President
National Cheng Kung University
Dr. Li Fung Chang
Chief Architect
5G Technology Program Office, DoIT, MOEA
Mr. Michael Campbell
Senior Vice President of Engineering
Qualcomm Incorporated
Mr. CJ Hsieh
General Manager
INTEL Innovation Technologies Ltd.
Mr. Artun Kutchuk
Vice President of Business Development and Strategy
Advantest Corporation
Dr. Patrick Huang
Senior R&D Manager
Chunghwa Precision Test Tech. Co., Ltd.
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