Mr. Harry H. Chen

Scientist, IC Testing
MediaTek Inc.
  • M.S. Electrical Engineering, Stanford University, USA
  • Invited keynote, First Annual SWTest Asia 2018, Taiwan​

  • Best paper award, Asian Test Symposium 2016, Japan​

  • Heterogeneous Integration Roadmap: System-Level Test Lead​

  • Senior IC design engineer, Analog Devices, USA​

  • Senior manager, Cadence Design Systems, USA​

Harry Chen is currently IC Testing Scientist at MediaTek. Besides research in advanced testing topics such as defect modeling and end-to-end test data analytics, he helps promote quality-related concepts throughout the company and with key suppliers and customers. Harry actively participates in test-related conferences such as ITC, ATS, ETS, VTS, and VLSI-DAT by serving on program committees, publishing papers, and giving talks. Harry is a core member of SEMI Taiwan Testing Committee. He also leads the System-Level Test focus group in the international Heterogeneous Integration Roadmap collaborative effort. Prior to MediaTek, Harry held technical positions at Analog Devices and Cadence Design Systems.
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